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Vol. 6 No. 01
DOI:
https://doi.org/10.22201/icat.24486736e.2008.6.01
Published:
2008-04-01
Articles
An automatic test environment for microelectronics education and research
Federico Sandoval-Ibarra
PDF
Diverse time-frequency distributions integrated to an art2 network for non-destructive testing
H. Benítez-Pérez, L. Medina-Gómez
PDF
Pattern Classification of Decomposed Wavelet Information using ART2 Networks for echoes Analysis
M. Solís, H. Benítez-Pérez, E. Rubio, L. Medina-Gómez, E. Moreno, G. Gonzalez, L. Leija
PDF
Measurement of Chua chaos and its applications
Ricardo Núñez Pérez
PDF
Ring CMOS NOT-based Oscillators: Analysis and Design
F. Sandoval-Ibarra, E. S. Hernández-Bernal
PDF