Nanocolumnar CdS thin films grown by glancing angle deposition from a sublimate vapor effusion source

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L. G. Daza
R. Castro Rodríguez
M. Cirerol Carrillo
E.A. Martín Tovar
J. Méndez- Gamboa
R. Medina Esquivel
I. Perez Quintana
A. Iribarren

Abstract

The glancing angle Deposition (GLAD) technique was used to grow cadmium sulfide (CdS) thin films on glass and indium tin oxide (ITO) coated glass substrates from a sublimate vapor effusion source. The samples were prepared under different incident deposition flux angles (a) of 0°, 20° and 80°, while both the substrate and the source were under rotation. The temperature of the source was 923.15 K. Scanning electron microscopy images showed that the GLAD method combined with the source produced dense nanocolumnar shaped structures with height and diameters of ~200 and ~30 nm respectively. The deposited films showed a hexagonal structure with preferential (002) plane orientation and crystallites sizes between ~25 nm and ~35 nm. A maximum solar weighted transmission of ~92% was obtained for the sample prepared at a =80°, with a substrate/source rotation velocity ratio of 55/20 in the wavelength region of 400-900 nm. The average band gap energy of the films was 2.42 eV. Refractive indexes between ~1.4 and ~2.4 at a 550 nm the wavelength were also obtained.

 

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How to Cite
Daza, L. G., Rodríguez, R., Carrillo, M., Tovar, E., Gamboa, J., Esquivel, R., Quintana, I., & Iribarren, A. (2019). Nanocolumnar CdS thin films grown by glancing angle deposition from a sublimate vapor effusion source. Journal of Applied Research and Technology, 17(1). https://doi.org/10.22201/icat.16656423.2019.17.1.753
Author Biographies

L. G. Daza

Department of Applied Physics, CINVESTAV-IPN, Unidad Mérida. 97310 Mérida, Yucatán, México

R. Castro Rodríguez

Department of Applied Physics, CINVESTAV-IPN, Unidad Mérida. 97310 Mérida, Yucatán, México

M. Cirerol Carrillo

Yucatan Autonomous University, Faculty of Engineering. AP 150 Cordemex, 97310 Mérida, Yucatán, México

E.A. Martín Tovar

Department of Applied Physics, CINVESTAV-IPN, Unidad Mérida. 97310 Mérida, Yucatán, México

J. Méndez- Gamboa

Yucatan Autonomous University, Faculty of Engineering. AP 150 Cordemex, 97310 Mérida, Yucatán, México

R. Medina Esquivel

Yucatan Autonomous University, Faculty of Engineering. AP 150 Cordemex, 97310 Mérida, Yucatán, México

I. Perez Quintana

Yucatan Autonomous University, Faculty of Engineering. AP 150 Cordemex, 97310 Mérida, Yucatán, México

A. Iribarren

Department of Applied Physics, CINVESTAV-IPN, Unidad Mérida. 97310 Mérida, Yucatán, México

Instituto de Ciencia y Tecnología de Materiales, Universidad de La Habana, Zapata y G, Vedado, La Habana 10400, Cuba