Attia, Attia A., Mohammed S. El-Bana, Doaa M. Habashy, Suzan S. Fouad, and Mahmoud Y. El-Bakry. “Optical Constants Characterization of As30 Se70?X Snx Thin Films Using Neural Networks”. Journal of Applied Research and Technology 15, no. 5 (June 14, 2019). Accessed May 3, 2024. https://jart.icat.unam.mx/index.php/jart/article/view/686.