Skvortsov, A. A., M. V. Koryachko, P. A. Skvortsov, and M. N. Luk’yanov. “The Problem of Crack Formation in Thin Sublayers of Silicon Oxide During Pulsed Heating of Interconnects”. Journal of Applied Research and Technology, vol. 19, no. 2, Apr. 2021, pp. 77-86, doi:10.22201/icat.24486736e.2021.19.2.1576.