ATTIA, A. A.; EL-BANA, M. S.; HABASHY, D. M.; FOUAD, S. S.; EL-BAKRY, M. Y. Optical constants characterization of As30 Se70?x Snx thin films using neural networks. Journal of Applied Research and Technology, [S. l.], v. 15, n. 5, 2019. DOI: 10.1016/j.jart.2017.03.009. Disponível em: https://jart.icat.unam.mx/index.php/jart/article/view/686. Acesso em: 3 may. 2024.