SANDOVAL-IBARRA, F. An automatic test environment for microelectronics education and research. Journal of Applied Research and Technology, [S. l.], v. 6, n. 01, 2008. DOI: 10.22201/icat.16656423.2008.6.01.509. Disponível em: https://jart.icat.unam.mx/index.php/jart/article/view/509. Acesso em: 18 may. 2024.