BALLESTEROS-ELIZONDO, S.; PARGA-TORRES, J. R.; RINCÓN-LÓPEZ, J. M.; PALACIOS-GONZÁLEZ, E. Transmission Electron Microscopy (TEM) Through Focused ION Beam (FIB) from Vitrified Chromium Wastes. Journal of Applied Research and Technology, [S. l.], v. 9, n. 02, 2011. DOI: 10.22201/icat.16656423.2011.9.02.459. Disponível em: https://jart.icat.unam.mx/index.php/jart/article/view/459. Acesso em: 7 may. 2024.