YEH, T.-M.; SUN, J.-J. Using the Monte Carlo Simulation Methods in Gauge Repeatability and Reproducibility of Measurement System Analysis. Journal of Applied Research and Technology, [S. l.], v. 11, n. 5, 2013. DOI: 10.1016/S1665-6423(13)71585-2. Disponível em: https://jart.icat.unam.mx/index.php/jart/article/view/283. Acesso em: 28 mar. 2024.